Latest news: The research this webinar is based on just won the DesignCon 2010 Paper Award in the Interconnect Design Category!
We’re sponsoring a webinar Frequency-Dependent Material Properties – Why You Should Care to be presented by Dr. Eric Bogatin, Signal Integrity Evangelist at Bogatin Enterprises. Because of our sponsorship, Eric is offering this educational webinar — normally $95 per student — free of charge.
Date/Time: Live broadcast on Thursday, Feb 25, 2010 at 1PM Eastern/10AM Pacific (recorded version will be posted shortly after live event).
Abstract: We hear a lot about "causal properties" of materials, or "frequency-dependent dielectric constant." How important are these concepts and what impact will ignoring them have on accurately predicting performance? These real world effects result in frequency dependent loss, frequency dependent characteristic impedance and frequency dependent propagation speed. So what?
In this webinar, we will introduce a simple way of describing frequency dependent properties of conductors and dielectrics and explore their impact on time domain performance, such as TDR response and eye degradation of high speed serial links. We will see how to interpret the behavior of real interconnects and at what bit rate causal properties are important and when they can be ignored.
Agilent Technologies
Packard Room B
10 N. Martingale Road
Suite 550
Schaumburg, IL
60173
Tuesday, March 23
Agilent Technologies
4330 West Chandler Blvd
Pinnacle/Ironwood Rooms
Chandler, AZ
85224
Thursday, March 25
Agilent Technologies – Rooms Balboa A and B
2125 E Katella Ave
Suite 300
Anaheim, CA
92806
Abstract: Signal integrity engineers need to determine ultralow BER contours for thousands of points in the design space in order to select the optimum set of characteristics for transmitter, channel, and receiver. Traditional techniques consume a prohibitively long simulation time. For this reason we’ve implemented a new statistical mode in our Channel Simulator that eliminates the need for long, multi-million-bit simulations. Now you can generate eye diagrams with ultralow BER contours in just a few seconds.
This in-depth hands-on workshop will demonstrate the “what if” design space exploration workflow that our new statistical eye diagram channel simulator enables, and will also cover tools and modes that can be used in exceptional cases (e.g. equalizer adaptation, non-linearity, or specific bit patterns) where statistical eye techniques cannot be applied.
You will get first hand experiencing using signal integrity features that are new in ADS 2009 Update 1 and EMPro 2009, including electromagnetic (EM) co-design using critical nets extracted from enterprise board tools such as Allegro.
Agenda: 9:30a Register/Breakfast
10:00a Hands-on workshop part 1: Introduction to Channel Simulator in ADS 2009 Update1
Bit-by-bit mode
Statistical mode
Channel Simulator hands on lab
Eye diagram simulation using bit-by-bit mode
Eye mask analysis
Statistical eye diagram and BER analysis
12:00p Lunch
1:00p Workshop part 2: EM Co-design:
Extracting critical nets using Allegro Design Flow Integration (Allegro DFI)
Momentum G2 Element: Method-of-moments EM simulator in ADS
FEM Element: Finite element method EM simulator in ADS
FDTD 3DEM simulation with EMPro
Q&A
3:00p end
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Every engineer wants an EDA tool that’s easy to use. But can things go too far? Find out in this (hopefully) hilarous 2010 sequel to my DesignCon Video Contest 2009 entry.
If you enjoyed this post, please spread the word by sharing and bookmarking:
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