Signal Integrity

On High Speed Digital Chip-to-Chip Links

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Frequency-Dependent Material Properties – Why You Should Care

January 20th, 2010 · Please leave a comment · Webcast

Welcome to Signal Integrity! Check out our “About” page for more info. Thanks for visiting.

Dr. Eric Bogatin We’re sponsoring a webinar Frequency-Dependent Material Properties – Why You Should Care to be presented by Dr. Eric Bogatin, Signal Integrity Evangelist at Bogatin Enterprises. Because of our sponsorship, Eric is offering this educational webinar — normally $95 per student — free of charge.

Date/Time: Live broadcast on Thursday, Feb 25, 2010 at 1PM Eastern/10AM Pacific (recorded version will be posted shortly after live event).

Abstract: We hear a lot about "causal properties" of materials, or "frequency-dependent dielectric constant." How important are these concepts and what impact will ignoring them have on accurately predicting performance? These real world effects result in frequency dependent loss, frequency dependent characteristic impedance and frequency dependent propagation speed. So what?

In this webinar, we will introduce a simple way of describing frequency dependent properties of conductors and dielectrics and explore their impact on time domain performance, such as TDR response and eye degradation of high speed serial links. We will see how to interpret the behavior of real interconnects and at what bit rate causal properties are important and when they can be ignored.

Click here to register: NMA-850 in the “No Myths Allowed” webinar series Frequency-Dependent Material Properties – Why You Should Care

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Revving up VPX for 10 Gbaud Operation

February 9th, 2010 · Please leave a comment · Guest Post

Thanks to our customers Bob Sullivan (VP Technology) and Michael Rose (Engineering Consultant) at Hybricon who co-authored a paper with our very own Jason Boh, Applications Engineer here in New England. It’s in COTS Journal and is entitled Case Study: Revving up VPX for 10 Gbaud Operation.

Abstract: Supporting 10 Gbaud data rates is a complex technical challenge. VPX is designed to handle such speeds, but a variety of system design issues must be considered at this level of signal transmission.

There’s also an extended version in PDF format here:

Revving up VPX for 10Gbaud operation – a case study for implementing IEEE 802.3ap 10GBASE-KR over a VPX backplane

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Statistical Simulation

February 9th, 2010 · Please leave a comment · Guest Post

My thanks to Chad Morgan (Principal Engineer, Circuits & Design, at Tyco Electronics) for permission to upload his DesignCon 2010 paper 7-TH3 here. It’s 2.4MB, so first here’s a quick preview:

Abstract

Because today’s high-speed, high-density backplane and I/O interconnects are pushing speeds well beyond 10 Gbps, accurate simulation of such systems requires the inclusion of long bit patterns, jitter, equalization, and crosstalk. To include these criteria and increase simulation speed, digital designers are migrating from traditional SPICE and convolution simulations to faster quasi-analytical or statistical simulations when possible. This paper will examine correlation between public-domain tools, EDA vendor tools, and test data using various highspeed interconnects as case studies. The paper will summarize how well simulation tools optimize equalization and predict system performance to low probability levels.

DesignCon 2010 7-TH3 Figure 11

Figure 11: Measured (white) and Simulated (blue) De-emphasized Eye Pattern at 6.25 Gbps through Test Cables. As Figure 11 shows, when using the same tap values for both measurement and simulation, correlation is excellent. Both de-emphasized waveforms show a similar rise-time, and both methods keep the same rise-time for both full-swing and partial-swing bits in the pattern.

Download the PDF

Validation of Quasi-Analytical and Statistical Simulation Techniques for Multi-Gigabit Interconnect Channels

Thanks again, Chad!

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